Title :
Priority-Based Distributed Manufacturing Process Modeling via Hierarchical Timed Color Petri Net
Author :
Lv, Y.Q. ; Lee, C.K.M. ; Wu, Zhisheng ; Chan, H.K. ; Ip, W.H.
Author_Institution :
Nanyang Technol. Univ., Singapore, Singapore
Abstract :
Petri net (PN) is a classical tool for modeling, simulation, and analysis. With the emergence of distributed manufacturing system (DMS), PN has been evolved into different forms such as colored PN (CPN) and timed PN (TPN). To fulfill the practical requirements, CPN has been extended to a larger and more complex model. Meanwhile, DMS becomes an important issue for industry, and how to model a complex manufacturing network for better throughput needs further investigation. A simple single type of PN only cannot fulfill all contemporary requirements at the same time. This paper proposes a new concept for a new PN-hierarchical timed CPN (HTCPN), which can be a powerful tool for modeling, simulation, and analysis for current large complex distributed manufacturing system. This paper presents a general structure of DMS and uses HTCPN to model the manufacturing system as discrete event with dynamic behavior. The proposed approach shows superiority on modeling large complex manufacturing system as it represents the material flow and transitions clearly and provides overview and detailed description for DMS.
Keywords :
Petri nets; complex networks; discrete event simulation; graph colouring; manufacturing processes; manufacturing systems; modelling; DMS; DMS structure; HTCPN; colored PN; complex distributed manufacturing system; complex manufacturing network; discrete event; dynamic behavior; hierarchical timed CPN; hierarchical timed color Petri net; large complex manufacturing system modeling; material flow; material transitions; priority-based distributed manufacturing process modeling; Analytical models; Manufacturing processes; Object oriented modeling; Petri nets; CPN tools; Petri net (PN); distributed manufacturing network; hierarchical timed colored Petri net (HTCPN); modeling;
Journal_Title :
Industrial Informatics, IEEE Transactions on
DOI :
10.1109/TII.2012.2215043