DocumentCode :
3504344
Title :
Theoretical investigations into the field enhancement factor of silicon structures
Author :
Langer, C. ; Prommesberger, C. ; Dams, F. ; Schreiner, R.
Author_Institution :
Fac. of Microsyst. Technol., Regensburg Univ. of Appl. Sci., Regensburg, Germany
fYear :
2012
fDate :
9-13 July 2012
Firstpage :
1
Lastpage :
2
Abstract :
In order to optimize our field-emitting silicon structures, the influence of geometric parameters like aspect ratio, aperture angle and curvature on the field enhancement factor was investigated by finite element simulations. A universal geometric model consisting of a rounded triangle and elliptic curvatures was taken for modeling a variety of different silicon tip as well as ridge structures. Whereas, a high dependency of the field enhancement on the aperture angle was found, the simulations show that the elliptic curvature affects the field enhancement only marginal.
Keywords :
elemental semiconductors; field emitter arrays; finite element analysis; silicon; Si; aperture angle; aspect ratio; elliptic curvatures; field enhancement factor curvature; field-emitting silicon structures; finite element simulations; ridge structures; rounded triangle curvatures; silicon field emitter array; silicon tip; universal geometric model; Apertures; Electric fields; Equations; Finite element methods; Mathematical model; Shape; Silicon; field enhancement factor; silicon field emitter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
Conference_Location :
Jeju
ISSN :
pending
Print_ISBN :
978-1-4673-1983-6
Electronic_ISBN :
pending
Type :
conf
DOI :
10.1109/IVNC.2012.6316886
Filename :
6316886
Link To Document :
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