Title :
Illustrating field emission theory by using plots of transmission probability and barrier strength
Author :
Fischer, Anath ; Mousa, Marwan S. ; Deane, Jonathan H. B. ; Forbes, Richard G.
Author_Institution :
Dept. of Phys., Mu´tah Univ., Al-Karak, Jordan
Abstract :
This poster is part of a continuing attempt to make field emission theory more transparent. When interpreting current-voltage characteristics related to cold field electron emission (CFE), it is widely assumed that these are controlled and dominated by the behaviour of the tunneling barrier at the emitter/vacuum interface. The transmission probability D for this barrier can be written D ≈ P exp[-G], where P is a transmission pre-factor and G is the JWKB exponent or "barrier strength". The influence of theoretical effects on the barrier form and on D can be illustrated by plotting (-G) and/or lnD as functions of reciprocal field or voltage. This is a specialized form of Fowler-Nordheim (FN) plot. Its usefulness as a pedagogical tool has perhaps been under-appreciated; it may also prove useful for discussing the issue of what causes curvature in FN plots.
Keywords :
electron field emission; probability; CFE; FN plot; Fowler-Nordheim plot; barrier strength; cold field electron emission; current-voltage characteristics; emitter-vacuum interface; field electron emission theory; transmission probability; tunneling barrier behaviour; Approximation methods; Current-voltage characteristics; Educational institutions; Electron emission; Equations; Physics; Tin; Fowler-Nordheim plots; barrier strength; theory of field electron emission; transmission probability;
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
Conference_Location :
Jeju
Print_ISBN :
978-1-4673-1983-6
Electronic_ISBN :
pending
DOI :
10.1109/IVNC.2012.6316938