DocumentCode :
3505624
Title :
The challenge of grinding technology for TSV and BSI device
Author :
Liew Loy Seng
Author_Institution :
DISCO HI-TEC CHINA Co., Ltd., Shanghai, China
fYear :
2012
fDate :
13-16 Aug. 2012
Firstpage :
1000
Lastpage :
1002
Abstract :
The demand from digital mobile industry is pushing the development of smaller, more compact and more effective electronic device likes SiP, RFID and etc in the past few years. For a higher performance and energy saving solution, the development of TSV (Through Silicon Via) package has been sped up for the past few years. In China, the development of TSV and BSI (Backside illumination) technology for high pixel camera module used in the smart phone is progressing rapidly since the past one year. For TSV and BSI device, the requirement of grinding process is different from the normal grinding system used in the backend assembly process. In this paper, the author would like to discuss about the requirement needed in this technology.
Keywords :
assembling; cameras; grinding; integrated circuit packaging; lighting; smart phones; three-dimensional integrated circuits; BSI device; RFID; SiP; TSV package; backend assembly process; backside illumination technology; digital mobile industry; electronic device; grinding process; grinding technology; high-pixel camera module; smart phone; through silicon via package; Abstracts; Rough surfaces; Surface roughness; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4673-1682-8
Electronic_ISBN :
978-1-4673-1680-4
Type :
conf
DOI :
10.1109/ICEPT-HDP.2012.6474775
Filename :
6474775
Link To Document :
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