Title :
Patterned cells for phase change memories
Author :
Jiang, Anxiao ; Zhou, Hongchao ; Wang, Zhiying ; Bruck, Jehoshua
Author_Institution :
Comput. Sci. & Eng., Texas A&M Univ., College Station, TX, USA
fDate :
July 31 2011-Aug. 5 2011
Abstract :
Phase-change memory (PCM) is an emerging nonvolatile memory technology that promises very high performance. It currently uses discrete cell levels to represent data, controlled by a single amorphous/crystalline domain in a cell. To improve data density, more levels per cell are needed. There exist a number of challenges, including cell programming noise, drifting of cell levels, and the high power requirement for cell programming. In this paper, we present a new cell structure called patterned cell, and explore its data representation schemes. Multiple domains per cell are used, and their connectivity is used to store data. We analyze its storage capacity, and study its error-correction capability and the construction of error-control codes.
Keywords :
error correction codes; phase change memories; cell level; cell programming noise; crystalline domain; data density; data representation; discrete cell level; error-control code; error-correction capability; high power requirement; nonvolatile memory technology; patterned cell; phase change memory; Arrays; Electrodes; Phase change materials; Programming; Resistance; Tiles; Upper bound;
Conference_Titel :
Information Theory Proceedings (ISIT), 2011 IEEE International Symposium on
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4577-0596-0
Electronic_ISBN :
2157-8095
DOI :
10.1109/ISIT.2011.6033979