DocumentCode :
3510456
Title :
Nonuniform image patch exemplars for low level vision
Author :
De Smet, V. ; Namboodiri, Vinay P. ; Van Gool, Luc
Author_Institution :
ESAT-PSI/iMinds, KU Leuven, Leuven, Belgium
fYear :
2013
fDate :
15-17 Jan. 2013
Firstpage :
23
Lastpage :
30
Abstract :
In this paper we propose the use of nonuniformly resized image patch exemplars for solving low level vision problems like denoising and super-resolution. While patch-based methods have been shown to be successful for several such applications, these methods have so far assumed uniform sizes for image patches. In this paper we address this restriction. We use an integral image representation for efficient computation of the matching cost for variable-sized patches. We show that nonuniform image patch exemplars are useful in improving classic techniques for nonlocal means-based denoising and example-based superresolution. We provide refinement cues to further improve the patch size estimation. This method can be adopted for a large number of related methods and applications due to its simplicity and generality.
Keywords :
image denoising; image matching; image representation; image resolution; example-based superresolution; image denoising; image super-resolution; integral image representation; low level vision problems; nonlocal means-based denoising; nonuniformly resized image patch exemplars; patch size estimation; patch-based methods; variable-sized patch matching cost; Databases; Image resolution; Nearest neighbor searches; Noise reduction; Optimization; Shape; Signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Computer Vision (WACV), 2013 IEEE Workshop on
Conference_Location :
Tampa, FL
ISSN :
1550-5790
Print_ISBN :
978-1-4673-5053-2
Electronic_ISBN :
1550-5790
Type :
conf
DOI :
10.1109/WACV.2013.6474995
Filename :
6474995
Link To Document :
بازگشت