Title :
A New Method to Predict Software Defect Based on Rough Sets
Author :
Weimin Yang ; Longshu Li
Author_Institution :
Key Lab. IC&SP, Anhui Univ., Hefei
Abstract :
High quality software should have as few defects as possible. Many modeling techniques have been proposed and applied for software quality prediction. Software projects vary in size and complexity, programming languages, development processes, etc. We research the correlation of software metrics focusing on the data sets of software defect prediction. A rough set model is presented to reduce the attributes of data sets of software defect prediction in this paper. Experiment shows its splendid performance.
Keywords :
programming languages; rough set theory; software metrics; software quality; programming languages; rough set model; software defect prediction; software metrics; software quality prediction; Information systems; Intelligent networks; Knowledge representation; Open source software; Predictive models; Rough sets; Set theory; Software metrics; Software quality; Uncertainty; Defect Prediction; Rough Sets; Software Metrics;
Conference_Titel :
Intelligent Networks and Intelligent Systems, 2008. ICINIS '08. First International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-0-7695-3391-9
Electronic_ISBN :
978-0-7695-3391-9
DOI :
10.1109/ICINIS.2008.132