Limitations due to systematic phase errors on the extraction of loss tangent from micron-sized transmission line test structures

Author

Friar, R.J. ; Neikirk, D.P.

Author_Institution

Texas Univ., Austin, TX, USA

fYear

1999

fDate

1999

Firstpage

67

Lastpage

70

Abstract

When two-port S-parameters are used to characterize microstrip test structures, finite phase measurement precision and small reference plane offsets can significantly limit the ability to extract the loss tangent from transmission lines with finite series resistance

Keywords

S-parameters; dielectric losses; dielectric thin films; electric resistance; error analysis; high-frequency transmission lines; integrated circuit interconnections; integrated circuit measurement; integrated circuit metallisation; integrated circuit packaging; measurement errors; microstrip lines; phase measurement; finite phase measurement precision; finite series resistance; loss tangent; loss tangent extraction; microstrip test structures; reference plane offsets; systematic phase errors; transmission line test structures; transmission lines; two-port S-parameters; Conducting materials; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency; Geometry; Microstrip; Phase measurement; Scattering parameters; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging, 1999

Conference_Location

San Diego, CA

Print_ISBN

0-7803-5597-0

Type

conf

DOI

10.1109/EPEP.1999.819195

Filename

819195