Title :
On completing the degrees of freedom characterization of MIMO interference networks with No CSIT
Author :
Vaze, Chinmay S. ; Varanasi, Mahesh K.
Author_Institution :
Dept. of Electr., Comput., & Energy Eng., Univ. of Colorado, Boulder, CO, USA
fDate :
July 31 2011-Aug. 5 2011
Abstract :
The two-user multi-input, multi-output (MIMO) interference and cognitive radio channels are studied under the assumption of no channel state information at the transmitter (CSIT) from the degrees of freedom (DoF) region perspective. With Mi and Ni denoting the number of antennas at transmitter i and receiver i respectively, the DoF region of the MIMO interference channel was recently characterized by Huang et al., Zhu and Guo, and by the authors of this paper for all values of the 4-tuple (M1,M2,N1,N2), except when min(M1,N1) >; N2 >; M2 (or min(M2,N2) >; N1 >; M1). This latter case was solved more recently by Zhu and Guo, who provided a tight outer-bound. Here, a simpler and more widely applicable proof of that outer-bound is given based on the idea of interference localization. Using it, the DoF region is also established for the class of MIMO cognitive radio channels (under certain restrictions on the fading distributions) when min(M1 + M2,N1) >; N2 >; M2 (with the second transmitter cognitive) - the only class for which the inner and outer bounds previously obtained by the authors were not tight.
Keywords :
MIMO communication; antennas; cognitive radio; interference suppression; radio transmitters; wireless channels; CSIT; DoF; MIMO; antennas; channel state information; cognitive radio channels; degrees of freedom; freedom characterization; inner bounds; interference localization; interference networks; multiple input multiple output; outer bounds; transmitter; Entropy; Fading; Integrated circuits; Interference; MIMO; Multiplexing; Random variables; Cognitive radio; Degrees of freedom; Interference networks; MIMO; Outer bound;
Conference_Titel :
Information Theory Proceedings (ISIT), 2011 IEEE International Symposium on
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4577-0596-0
Electronic_ISBN :
2157-8095
DOI :
10.1109/ISIT.2011.6034164