• DocumentCode
    3511403
  • Title

    Entanglement boosts quantum turbo codes

  • Author

    Wilde, Mark M. ; Hsieh, Min-Hsiu

  • Author_Institution
    Sch. of Comput. Sci., McGill Univ., Montreal, QC, Canada
  • fYear
    2011
  • fDate
    July 31 2011-Aug. 5 2011
  • Firstpage
    445
  • Lastpage
    449
  • Abstract
    One of the unexpected breakdowns in the existing theory of quantum serial turbo coding is that a quantum convolutional encoder cannot simultaneously be recursive and non-catastrophic. These properties are essential for a quantum turbo code to have an unbounded minimum distance and for its iterative decoding algorithm to converge, respectively. Here, we show that the entanglement-assisted paradigm gives a theoretical and simulated “turbo boost” to these codes, in the sense that an entanglement-assisted quantum (EAQ) convolutional encoder can possess both of the aforementioned desirable properties, and simulation results indicate that entanglement-assisted turbo codes can operate reliably in a noise regime 5.5 dB beyond that of standard quantum turbo codes. Entanglement is the resource that enables a convolutional encoder to satisfy both properties because an encoder acting on only information qubits, classical bits, gauge qubits, and ancilla qubits cannot simultaneously satisfy them. Simulation results demonstrate that interleaved serial concatenation of EAQ convolutional encoders leads to a powerful code construction with excellent performance on a memoryless depolarizing channel.
  • Keywords
    encoding; iterative decoding; turbo codes; EAQ convolutional encoder; entanglement boost quantum serial turbo codes; entanglement-assisted paradigm; entanglement-assisted quantum convolutional encoder; iterative decoding algorithm; memoryless depolarizing channel; unbounded minimum distance; Convolutional codes; Iterative decoding; Noise; Quantum entanglement; Turbo codes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Proceedings (ISIT), 2011 IEEE International Symposium on
  • Conference_Location
    St. Petersburg
  • ISSN
    2157-8095
  • Print_ISBN
    978-1-4577-0596-0
  • Electronic_ISBN
    2157-8095
  • Type

    conf

  • DOI
    10.1109/ISIT.2011.6034165
  • Filename
    6034165