DocumentCode
3511771
Title
Covering point patterns
Author
Lapidoth, Amos ; Malär, Andreas ; Wang, Ligong
Author_Institution
ETH Zurich, Zurich, Switzerland
fYear
2011
fDate
July 31 2011-Aug. 5 2011
Firstpage
51
Lastpage
55
Abstract
A source generates a “point pattern” consisting of a finite number of points in an interval. Based on a binary description of the point pattern, a reconstructor must produce a “covering set” that is guaranteed to contain the pattern. We study the optimal trade-off (as the length of the interval tends to infinity) between the description length and the least average Lebesgue measure of the covering set. The trade-off is established for point patterns that are generated by a Poisson process. Such point patterns are shown to be the most difficult to describe. We also study a Wyner-Ziv version of this problem, where some of the points in the pattern are known to the reconstructor but not to the encoder. We show that this scenario is as good as when they are known to both encoder and reconstructor.
Keywords
binary sequences; encoding; set theory; stochastic processes; Poisson process; least average Lebesgue measure; optimal trade-off; point pattern cover; Computers; Decoding; Distortion measurement; Encoding; Image reconstruction; Indexes; Rate-distortion;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory Proceedings (ISIT), 2011 IEEE International Symposium on
Conference_Location
St. Petersburg
ISSN
2157-8095
Print_ISBN
978-1-4577-0596-0
Electronic_ISBN
2157-8095
Type
conf
DOI
10.1109/ISIT.2011.6034182
Filename
6034182
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