DocumentCode :
3512057
Title :
Storage reliability
Author :
Rooney, John P.
Author_Institution :
Sippican Inc., Marion, MA, USA
fYear :
1989
fDate :
24-26 Jan 1989
Firstpage :
178
Lastpage :
182
Abstract :
Reviews the methods and models of US Air Force publication RADC-TR-85-91 (Impact of nonoperating periods on equipment reliability). Example calculations are presented, and statistical techniques are used to compare the data from the literature with the RADC-calculated storage failure rates for simple components, systems, and an exotic component. Areas for improvement are noted, including the refinement of the environmental factors, addition to methods to deal with surface-mount components, and (for completeness) a section on nonelectronic components. It is noted that components with a known shelf life should be clearly identified, so that analysts do not attempt to predict a storage failure rate beyond the end of life for those components
Keywords :
electronic equipment testing; failure analysis; reliability; statistical analysis; RADC-TR-85-91; RADC-calculated storage failure rates; US Air Force; environmental factors; nonelectronic components; shelf life; statistical techniques; storage reliability; surface-mount components; Assembly systems; Electronic components; Electronic equipment; Environmental factors; Equations; Face recognition; Failure analysis; Missiles; Physics computing; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1989. Proceedings., Annual
Conference_Location :
Atlanta, GA
Type :
conf
DOI :
10.1109/ARMS.1989.49596
Filename :
49596
Link To Document :
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