DocumentCode :
3512211
Title :
The microwave measurement of the dielectric properties by the parallel plate resonator and ceramic cavity method
Author :
Yoon, Jung-Rag ; Kwon, Jung-Youl ; Lee, Heun-Yong
Author_Institution :
Myong Ji Univ., Kyunggi, South Korea
Volume :
2
fYear :
1997
fDate :
25 -30 May 1997
Firstpage :
964
Abstract :
We have studied the measurement of low dielectric loss materials using a parallel plate resonator and ceramic cavity method. The measurement error of dielectric constant was 0.03%, due to reasons such as the difference diameter of the loop and the air gap effect. Reliable Q×f values were determined with a probe size of less than 2 mm and an insertion loss of more than 25 dB. Surface roughness could be reduced to less than 0.05 μm. Measurement accuracy of the temperature coefficient of resonance frequency was improved to within ±0.2 by using the ceramic cavity
Keywords :
Q-factor measurement; cavity resonators; measurement errors; microwave measurement; permittivity measurement; surface topography; air gap effect; ceramic cavity; dielectric constant; dielectric properties; insertion loss; low dielectric loss materials; measurement error; microwave measurement; parallel plate resonator; probe; surface roughness; temperature coefficient of resonance frequency; Ceramics; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Loss measurement; Measurement errors; Microwave measurements; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-2651-2
Type :
conf
DOI :
10.1109/ICPADM.1997.616603
Filename :
616603
Link To Document :
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