DocumentCode :
3512235
Title :
-1/+0.8°C error, accurate temperature sensor using 90nm 1V CMOS for on-line thermal monitoring of VLSI circuits
Author :
Sasaki, Masahiro ; Ikeda, Makoto ; Asada, Kunihiro
Author_Institution :
VLSI Design & Educ. Center, Tokyo Univ., Japan
fYear :
2006
fDate :
6-9 March 2006
Firstpage :
9
Lastpage :
12
Abstract :
This paper proposes quite accurate four-transistor temperature sensor designed and developed for thermal testing and monitoring of VLSI circuits. The sensor is featured with an extremely small area of 11.6×4.1μm2 and low power consumption of about 25μW. The performance of the sensor is highly linear and the predicted temperature error is merely -1.0∼+0.8°C using two-point calibration within the range of 50∼125°C. The sensor is implemented in ASPLA CMOS 90nm 1P6M process, operated at supply voltage of 1V, and tested successfully.
Keywords :
CMOS integrated circuits; VLSI; integrated circuit measurement; temperature sensors; 1 V; 90 nm; VLSI circuits; online thermal monitoring; temperature sensor; thermal testing; two-point calibration; Circuit testing; Diodes; Energy consumption; Linearity; Monitoring; Temperature control; Temperature measurement; Temperature sensors; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on
Print_ISBN :
1-4244-0167-4
Type :
conf
DOI :
10.1109/ICMTS.2006.1614264
Filename :
1614264
Link To Document :
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