DocumentCode
351233
Title
A scanning tunneling microscope control system with potentiometric capability
Author
Bredekamp, AH ; Tapson, J.
Author_Institution
Dept. of Electr. Eng., Cape Town Univ., Rondebosch, South Africa
Volume
1
fYear
1999
fDate
1999
Firstpage
61
Abstract
This paper describes the design of a scanning tunneling microscope (STM) control system and the addition of a high current, high frequency scanning tunneling potentiometry (STP) stage. This combination of STM and STP allows for the extraction of topographic and also potentiometric information in two dimensions on a sub-micron scale
Keywords
physical instrumentation control; potentiometers; scanning tunnelling microscopy; control system; scanning tunneling microscope; scanning tunneling potentiometry; Bandwidth; Cities and towns; Control systems; Elementary particle vacuum; Gold; Microscopy; Resonance; Resonant frequency; Tunneling; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Africon, 1999 IEEE
Conference_Location
Cape Town
Print_ISBN
0-7803-5546-6
Type
conf
DOI
10.1109/AFRCON.1999.820754
Filename
820754
Link To Document