Title :
A scanning tunneling microscope control system with potentiometric capability
Author :
Bredekamp, AH ; Tapson, J.
Author_Institution :
Dept. of Electr. Eng., Cape Town Univ., Rondebosch, South Africa
Abstract :
This paper describes the design of a scanning tunneling microscope (STM) control system and the addition of a high current, high frequency scanning tunneling potentiometry (STP) stage. This combination of STM and STP allows for the extraction of topographic and also potentiometric information in two dimensions on a sub-micron scale
Keywords :
physical instrumentation control; potentiometers; scanning tunnelling microscopy; control system; scanning tunneling microscope; scanning tunneling potentiometry; Bandwidth; Cities and towns; Control systems; Elementary particle vacuum; Gold; Microscopy; Resonance; Resonant frequency; Tunneling; Voltage control;
Conference_Titel :
Africon, 1999 IEEE
Conference_Location :
Cape Town
Print_ISBN :
0-7803-5546-6
DOI :
10.1109/AFRCON.1999.820754
