DocumentCode :
3512588
Title :
Ring oscillator based technique for measuring variability statistics
Author :
Bhushan, Manjul ; Ketchen, Mark B. ; Polonsky, Stas ; Gattiker, Anne
Author_Institution :
IBM Syst. & Technol. Group, Poughkeepsie, NY, USA
fYear :
2006
fDate :
6-9 March 2006
Firstpage :
87
Lastpage :
92
Abstract :
Device parameter induced frequency variations in a dense array of nominally identical ring oscillators are measured by sequentially combining the output frequencies into a single frequency modulated signal with the statistical frequency parameters read out by a standard frequency counter. For the example described here, the ring oscillators are designed to capture random variations in MOSFET threshold voltages.
Keywords :
MOSFET; feedback oscillators; MOSFET threshold voltages; frequency counter; frequency modulated signal; ring oscillator; statistical frequency parameters; variability statistics; Circuit testing; Counting circuits; Data analysis; Decoding; Delay; Frequency; MOSFET circuits; Ring oscillators; Statistics; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on
Print_ISBN :
1-4244-0167-4
Type :
conf
DOI :
10.1109/ICMTS.2006.1614281
Filename :
1614281
Link To Document :
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