Towards cost-effective antireflective-coating and surface-texturing

Author

Matsumoto, Yasuhiro ; Urbano, J. Antonio ; Ortega, Mauricio ; Barrera, Enrique ; Romero-Paredes, Gabriel

Author_Institution

Dept. de Ing. Electr., CINVESTAV-IPN, Mexico City, Mexico

fYear

2012

fDate

3-8 June 2012

Abstract

Methods for reducing surface reflectance in crystalline-silicon (c-Si) based solar cells is briefly reviewed. In general, an antireflection coating (ARC) is designed for normal light incidence, which consists of a single quarter-wavelength (λ/4) layer with a proper optical transparency. Theoretical and experimental comparisons were carried out for both, single and double ARC using silicon nitride (SiN_x) and silicon oxide (SiO_x). Double ARC for MgF/CeO, ZnS, TiO_x is also considered to compare with the previous coatings. Solar cell surface texturization and its effects are also discussed. Concepts of reactive ion etching (RIE) and its performances on c-Si based surfaces are viewed. Finally, graded-index ARC performances as a function of light incidence angles are discussed.

Keywords

coatings; silicon compounds; solar cells; surface texture; titanium compounds; zinc compounds; SiN; SiO; TiO; ZnS; cost-effective antireflective-coating; crystalline-silicon based solar cells; graded-index ARC performances; light incidence angles function; reactive ion etching; silicon nitride; silicon oxide; single quarter-wavelength layer; solar cell surface texturization; surface reflectance; surface-texturing; Chemicals; Indexes; Resistance; Sulfur hexafluoride; Antireflective coat; incidence angle; refraction index;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE

Conference_Location

Austin, TX

ISSN

0160-8371

Print_ISBN

978-1-4673-0064-3

Type

conf

DOI

10.1109/PVSC.2012.6317615

Filename

6317615