DocumentCode
351353
Title
Extending Moore´s Law through advances in semiconductor manufacturing equipment
Author
Sinha, Ashok K.
Author_Institution
Appl. Mater. Inc., Santa Clara, CA, USA
fYear
2000
fDate
2000
Firstpage
243
Lastpage
244
Abstract
Summary form only given, as follows. After more than thirty years of effectiveness, associated benefits to the electronics industry and several false alarms, it appears that Moore´s Law is again threatened with derailment. These threats are in the form of a convergence of three waves which requires major necessary changes relating to: a) lithography below 0.13 μm, which involves printing and aligning at submicron wavelength dimensions with new unproven lasers/lens systems; b) Cu/low-κ interconnect technology, which is facing major challenges in achieving commercially viable yields; and c) 300 mm wafer size conversion, which requires an extensive retooling of the entire industry. These enabling changes are overlaid on increasingly aggressive cost/quality requirements on the semiconductor fabs as the electronics industry evolves into the post-PC, Internet era. The author reviews some of the cutting edge work being done in the semiconductor manufacturing equipment area, including extendability/reuse of existing installed base for multiple generations, improved BKM´s (Best Known Methodologies) and integrated process modules
Keywords
electronics industry; integrated circuit manufacture; nanotechnology; semiconductor device manufacture; 0.13 micron; 300 mm; BKM improvement; Best Known Methodologies; Cu; Cu/low-κ interconnect technology; Moore´s Law extension; electronics industry; integrated process modules; nanolithography; retooling; semiconductor fabs; semiconductor manufacturing equipment; wafer size conversion; Electronics industry; Laser transitions; Lenses; Lithography; Manufacturing industries; Moore´s Law; Printing; Railway accidents; Semiconductor lasers; Wavelength conversion;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-0525-2
Type
conf
DOI
10.1109/ISQED.2000.838878
Filename
838878
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