• DocumentCode
    3513641
  • Title

    Large area imprinted surface textures for omnidirectional conformal AR coatings on flexible amorphous silicon solar cells

  • Author

    Chadha, Arvinder Singh ; Cline, Eric D. ; Tao, Meng ; Zhou, Weidong

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Texas at Arlington, Arlington, TX, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    Inverted pyramid surface textures are demonstrated on flexible amorphous Si solar cells based on a resin imprint process. The surface texture reduces the reflectivity of the cells over a broad spectrum. The texture leads to relative cell efficiency increases from 7% at 0° (surface-normal incident) to as high as 22% at 60°. Larger efficiency improvement at higher incident angles is a result of the broad spectrum omni-directional suppression in reflection. The current-voltage characteristics show that the open circuit voltage remains almost constant but the surface texture increases the short circuit current in the amorphous Si solar cell. This suggests that the efficiency improvement is primarily due to improved coupling of light into the cell. This omnidirectional surface texture is a promising method for anti-reflection in all kinds of cells-crystalline Si, amorphous Si, thin films, and organic solar cells.
  • Keywords
    conformal coatings; elemental semiconductors; silicon; solar cells; broad spectrum omni-directional suppression; cell efficiency; current-voltage characteristics; flexible amorphous silicon solar cells; incident angles; inverted pyramid surface textures; large area imprinted surface textures; omnidirectional conformal AR coatings; open circuit voltage; resin imprint process; short circuit current; Coatings; Photovoltaic cells; Reflection; Resins; Silicon; Surface texture; Surface treatment; amorphous silicon; flexible solar cell; inverted pyramid; large area; omnidirectional; surface texturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6317628
  • Filename
    6317628