Title :
The bayesian reliability growth model of exponential product based on dynamic distribution parameters
Author :
Tao, Junyong ; Ming, Zhimao ; Chen, Xun
Author_Institution :
Reliability Eng. Lab., Nat. Univ. of Defense Technol., Changsha, China
Abstract :
Regarding to the problems of traditional reliability growth models, for example, Duane model, which have been used in the multiple stages reliability assessment. This paper firstly studied on the statistical analysis method of different stages and different level data based on sequence binding model, then modeled the change event of dynamic distribution parameters during test and gave the Bayesian reliability growth model of multiple stages exponential distribution product. Finally the method has been validated by a practice example.
Keywords :
Bayes methods; production management; reliability; statistical distributions; Bayesian reliability growth model; dynamic distribution parameters; exponential product; sequence binding; statistical analysis; Bayesian methods; Design optimization; Electronic mail; Exponential distribution; Hazards; Laboratories; Life testing; Reliability engineering; Statistical analysis; Statistical distributions; Bayes; Non-Homogeneous populations statistic; exponential distribution; reliability growth model; sequence relationship;
Conference_Titel :
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4903-3
Electronic_ISBN :
978-1-4244-4905-7
DOI :
10.1109/ICRMS.2009.5270179
