• DocumentCode
    3514686
  • Title

    Research on framework of reliability interactive simulation analysis based on HLA

  • Author

    Wang, Wei ; Liu, Huilin

  • Author_Institution
    China Astronaut. Stand. Inst., Beijing, China
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    201
  • Lastpage
    204
  • Abstract
    According to the requirement of reliability simulation technology development, and on the basis of summarizing the research results of reliability simulation technology, a framework of reliability interactive simulation (RIS) based on high layer architecture (HLA) is proposed. The framework which is mainly structured on HLA, combines the interactive simulation technology with reliability analysis technology. The design object of the framework is to realize the reliability comprehensive analysis and further implement the optimization of reliability design and analysis (RDA) process by reliability simulation technology integration and interaction. In addition, the paper also pertinently discusses the realization of the framework of RIS, and presents the guide of its development and possible breakthroughs in future.
  • Keywords
    CAD; digital simulation; interactive systems; product design; product development; reliability; computer aided design and analysis; high layer architecture; product design; product development; reliability comprehensive analysis; reliability design; reliability interactive simulation analysis; reliability simulation technology development; Analytical models; Computational modeling; Computer architecture; Design optimization; Electronic mail; Paper technology; Product design; Product development; Space technology; Standards development; Comprehensive analysis; Federate simulation; High layer architecture; Interactive simulation; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-4903-3
  • Electronic_ISBN
    978-1-4244-4905-7
  • Type

    conf

  • DOI
    10.1109/ICRMS.2009.5270208
  • Filename
    5270208