DocumentCode :
351498
Title :
ESD protection techniques for semiconductor devices
Author :
Vinson, J.E. ; Liou, J.J.
Author_Institution :
Reliability Dept., Harris Semicond., Melbourne, FL, USA
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
311
Abstract :
Electrostatic discharges (ESD) are everywhere-in our homes, businesses and even at the manufacturers of the electronics we buy. The discharges cause failure of these electronic components. Presented here is a two pronged approach for ESD protection: reduce the likelihood of having an ESD event and improving the robustness of the devices. The first approach focuses on reducing the charge developed and controlling the redistribution of any charges that are developed. The second approach looks at ways to improve both the processes used to build electronics as well as the devices themselves
Keywords :
electrostatic discharge; failure analysis; semiconductor device reliability; ESD protection techniques; electrostatic discharges; failure; semiconductor devices; Biological system modeling; Capacitors; Circuits; Electrostatic discharge; Humans; Protection; Robustness; Semiconductor devices; USA Councils; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
Conference_Location :
Nis
Print_ISBN :
0-7803-5235-1
Type :
conf
DOI :
10.1109/ICMEL.2000.840579
Filename :
840579
Link To Document :
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