• DocumentCode
    3515484
  • Title

    High-speed indium electrodeposition: Efficient, reliable TIM technology

  • Author

    Szöcs, Edit ; Schwager, Felix ; Toben, Michael ; Brese, Nathaniel

  • Author_Institution
    Rohm & Haas Electron. Mater., Littau
  • fYear
    2008
  • fDate
    1-4 Sept. 2008
  • Firstpage
    347
  • Lastpage
    350
  • Abstract
    A new indium electroplating process was developed which provides pure indium deposits suitable as thermal interface materials (TIM) in electronic industry. The main goals of the project were: i.) to develop a stable, high speed indium plating process; ii.) to obtain pure indium deposits with a low melting point (156degC) and high thermal conductivity (82 W/mldrK); iii.) to provide good adhesion to the substrate with a void-free interface. The electrochemical plating bath is based on an acidic electrolyte with copolymer additives. Typical plating conditions are: pH 0.9-1.2, current density 0.5-20ASD, temperature 30-60degC and a metal ion concentration of 30-60 g/l. Uniform deposit thicknesses of a few microns up to several hundred microns can be achieved at a plating rate of 180 microns per hour at a current density of 10ASD. Good adhesion to standard nickel-plated substrates (no delamination or voids allowed) is critical for meeting the thermal and reliability targets. Adherent, void-free deposits were obtained with thermal conductivity and thermal expansion data that correspond favourably to literature values for the bulk metal.
  • Keywords
    adhesion; electroplating; indium; thermal conductivity; thermal expansion; In; acidic electrolyte; adhesion; copolymer additives; electrochemical plating bath; electronic industry; electroplating; high-speed electrodeposition; indium deposits; indium electrodeposition; melting point; nickel-plated substrates; reliability; temperature 156 degC; temperature 30 degC to 60 degC; thermal conductivity; thermal expansion; thermal interface materials; thermal targets; void-free deposits; void-free interface; Additives; Adhesives; Conducting materials; Current density; Delamination; Electronics industry; Indium; Temperature; Thermal conductivity; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
  • Conference_Location
    Greenwich
  • Print_ISBN
    978-1-4244-2813-7
  • Electronic_ISBN
    978-1-4244-2814-4
  • Type

    conf

  • DOI
    10.1109/ESTC.2008.4684373
  • Filename
    4684373