• DocumentCode
    3516865
  • Title

    High precision Thick-Film load cell for dynamic force measurement

  • Author

    Crescini, Damiano ; Crescini, Paolo

  • Author_Institution
    Dept. of Inf. Eng. (DII), Univ. of Brescia, Brescia, Italy
  • fYear
    2012
  • fDate
    7-9 Feb. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The application of load cells in industry generally requires good basic materials and accurate performance in a wide range of environments. Differences exist in manufacturing technologies, intended application, performance and cost; however, hysteresis, frequency response and creep can be a common source of errors in standard strain gauge cells. In this paper, we present a small structure based on piezoresistive effect, implemented in Thick-Film Technology (TFT) on 96% alumina substrate, working as load cell with high resonance frequency and low creep effects. The analytic model has been verified by using simulation based on finite element methods (FEM), resulting in satisfactory agreement. Based on a figure of merit (the product of the sensitivity and the square of the resonant frequency), optimized design rules are obtained for the sensors of various measure-ranges from 1 N to 10 N.
  • Keywords
    creep; finite element analysis; force measurement; frequency response; hysteresis; piezoresistive devices; resistors; strain gauges; FEM; alumina substrate; dynamic force measurement; finite element method; frequency response; high precision thick film load cell; high resonance frequency; hysteresis; low creep effects; optimized design rules; piezoresistive effect; strain gauge cells; Bridge circuits; Finite element methods; Sensitivity; Temperature measurement; Temperature sensors; Thin film transistors; figure-of-merit; load cell; piezoresistors; thick-film technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors Applications Symposium (SAS), 2012 IEEE
  • Conference_Location
    Brescia
  • Print_ISBN
    978-1-4577-1724-6
  • Type

    conf

  • DOI
    10.1109/SAS.2012.6166302
  • Filename
    6166302