• DocumentCode
    3516877
  • Title

    Strain-rate effects on mechanical properties for SAC387 and SAC105-Y solder

  • Author

    Xu, Luhua ; Tan, Kok Ee ; Pang, John H L

  • Author_Institution
    Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore
  • fYear
    2008
  • fDate
    1-4 Sept. 2008
  • Firstpage
    845
  • Lastpage
    850
  • Abstract
    In this paper, solder alloy of Sn-3.8Ag-0.7Cu (SAC387) and Sn-1.0Ag-0.5Cu-Y (SAC105-Y), where Y is a small addition of a fourth element, were tested at room temperature to study the strain-rate-dependent elastic modulus and yield strength of the solder. Nano-indentation tests were conducted at various strain rates from 10-3 to 101 1/s by using the continuous stiffness measurement (CSM) technique. Microstructures of the IMC for SAC105-Y on NiAu surface finish and OSP surface finish were investigated prior to the nano-indentation tests. Based on the test results, the higher the strain rate the higher the elastic modulus and yield stress of the solder. The power law relationship is used to curve fit the strain-rate-dependent yield stress with the indentation strain rate.
  • Keywords
    copper alloys; deformation; elastic moduli; impact testing; nanoindentation; nickel alloys; silver alloys; solders; tin alloys; yield strength; NiAu; SnAgCu-Y; continuous stiffness measurement; drop impact; elastic modulus; nanoindentation tests; solder alloys; strain-rate effects; temperature 293 K to 298 K; yield strength; Capacitive sensors; Environmentally friendly manufacturing techniques; Lead; Mechanical factors; Silver; Soldering; Strain measurement; Stress measurement; Temperature; Testing; continuous stiffness measurement; drop impact; nano-indentation; solder joint; strain-rate;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
  • Conference_Location
    Greenwich
  • Print_ISBN
    978-1-4244-2813-7
  • Electronic_ISBN
    978-1-4244-2814-4
  • Type

    conf

  • DOI
    10.1109/ESTC.2008.4684462
  • Filename
    4684462