Title :
The device on continuity covering test under high voltage for enamelled wires
Author :
Qiuguang, Wang ; Dianchuen, Zheng ; Bin, Liu
Author_Institution :
Harbin Univ. of Sci. & Technol., China
Abstract :
The paper described a design of the device on continuity covering test under high voltage for enamelled wires, discussed its circuit principle and design method of program. The specifications of the device meet the standard GB4074.20-91, so it gives a new means to practice continuity covering test under high voltage for enamelled wires method in our country
Keywords :
high-voltage techniques; insulated wires; insulation testing; GB4074.20-91 standard; circuit; continuity covering test; enamelled wire; high voltage device; program; Circuit testing; Copper; Hardware; IEC standards; Light emitting diodes; Microcomputers; Paper technology; Pulleys; Voltage; Wires;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-2651-2
DOI :
10.1109/ICPADM.1997.616642
