Title :
2008 9th international conference on ULtimate Integration on Silicon
Abstract :
The following topics are dealt: ultimate integration on silicon; advanced semiconductor device technology; innovative nano-electronic devices; pMOSFET and FinFET modelling; strained silicon devices; gate dielectrics; semiconductor device modeling and characterization.
Keywords :
MOSFET; dielectric materials; elemental semiconductors; nanoelectronics; semiconductor device models; semiconductor technology; silicon; FinFET modelling; Si; advanced semiconductor device technology; gate dielectrics; innovative nanoelectronic devices; pMOSFET characterization; silicon; strained silicon devices;
Conference_Titel :
Ultimate Integration of Silicon, 2008. ULIS 2008. 9th International Conference on
Conference_Location :
Udine
Print_ISBN :
978-1-4244-1729-2
DOI :
10.1109/ULIS.2008.4527125
