Title :
IOS-a new type of materials combination for system-on-a chip preparation
Author :
Tong, Q.-Y. ; Huang, L.-J. ; Chao, Y.-L. ; Gang, Q. ; Goesele, U.
Author_Institution :
Sch. of Eng., Duke Univ., Durham, NC, USA
Abstract :
IOS (insulator-on-semiconductor) has emerged as a new type of materials combination for system-on-a chip preparation. For high frequency mobile communication systems, a thin layer of piezoelectric or ferroelectric oxide crystal such as quartz, LiTaO/sub 3/ or LiNbO/sub 3/ on Si is required for high Q-factor and low temperature coefficient SAW filters, surface resonators and oscillators. Combining these materials with Si can lead to the integration of electronic and acoustic devices on the same chip. Voltage-controlled and temperature-compensated high Q-factor crystal oscillators and resonators can thus be realized. The integration of high performance GaAs photodetectors with LiNbO/sub 3/ waveguides makes integrated optical circuits possible. By preparing a thin layer of single crystalline transition metal oxides such as magnetic garnets on Si or on III-V semiconductors, stabilized laser diodes can be realized due to the availability of on-chip thin film optical isolators and circulators. Layer transfer by wafer bonding and H-induced layer splitting provides a manufacturable technology for IOS preparation. In this study, we report feasibility study results for IOS preparation with an insulator layer of many single crystalline insulators such as c-sapphire, LaAlO/sub 2/, PLZT and LiNbO/sub 3/. We have demonstrated that surface blistering and layer splitting of these materials is possible if H implantation is performed at wafer temperatures within the specific temperature range for each material.
Keywords :
Q-factor; crystal oscillators; crystal resonators; ferroelectric thin films; insulating thin films; integrated circuit technology; integrated optoelectronics; ion implantation; microprocessor chips; optical waveguides; photodetectors; piezoelectric thin films; semiconductor lasers; silicon-on-insulator; surface acoustic wave filters; surface treatment; voltage-controlled oscillators; wafer bonding; Al/sub 2/O/sub 3/-Si; GaAs; GaAs photodetectors; H; H implantation; H-induced layer splitting; III-V semiconductor substrates; IOS materials combination; IOS preparation; LaAlO/sub 2/ film; LaAlO/sub 2/-Si; LiNbO/sub 3/; LiNbO/sub 3/ film; LiNbO/sub 3/ thin film; LiNbO/sub 3/ waveguides; LiNbO/sub 3/-Si; LiTaO/sub 3/ thin film; LiTaO/sub 3/-Si; PLZT film; PLZT-Si; PbLaZrO3TiO3-Si; Q-factor; SAW filters; Si; Si substrate; SiO/sub 2/-Si; c-sapphire film; electronic/acoustic device integration; ferroelectric oxide crystal layer; high frequency mobile communication systems; insulator layer; insulator-on-semiconductor; integrated optical circuits; layer splitting; layer transfer; magnetic garnets; manufacturable technology; material-specific temperature range; on-chip thin film optical circulators; on-chip thin film optical isolators; piezoelectric oxide crystal layer; quartz thin film; single crystalline insulators; single crystalline transition metal oxide layers; stabilized laser diodes; surface blistering; surface oscillators; surface resonators; system-on-a chip preparation; temperature coefficient; temperature-compensated crystal oscillators; temperature-compensated crystal resonators; voltage-controlled crystal oscillators; voltage-controlled crystal resonators; wafer bonding; wafer temperature; Crystalline materials; Crystallization; Ferroelectric materials; Insulation; Optical films; Optical resonators; Optical surface waves; Optical waveguides; Q factor; Voltage-controlled oscillators;
Conference_Titel :
SOI Conference, 1999. Proceedings. 1999 IEEE International
Conference_Location :
Rohnert Park, CA, USA
Print_ISBN :
0-7803-5456-7
DOI :
10.1109/SOI.1999.819874