• DocumentCode
    3519294
  • Title

    A novel solar simulator based on a super-continuum laser

  • Author

    Dennis, Tasshi ; Schlager, John B. ; Yuan, Hao-Chih ; Wang, Qi ; Friedman, Daniel

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    The design and operation of a novel solar simulator based on a high-power, super-continuum fiber laser is described in this work. The simulator features a multi-sun irradiance with continuous spectral coverage from the visible to the infrared. By use of a prism-based spectral shaper, the simulator can be matched to any desired spectral profile, including the ASTM G-173-03 air-mass 1.5 direct or other global reference spectra. The simulator has been effectively used to measure the efficiency of gallium-arsenide (GaAs) and crystalline silicon (Si) solar cells, showing good agreement with independent measurements. The pulsed temporal characteristic of the simulator was studied and shown to have a negligible influence on measurements of cell efficiency for both GaAs and Si materials. The ability to arbitrarily shape the spectrum of the simulator may find application in multi-junction testing, and the potential for diffraction-limited focusing could enable localized excitation of advanced photovoltaic materials.
  • Keywords
    III-V semiconductors; elemental semiconductors; fibre lasers; gallium arsenide; silicon; solar cells; supercontinuum generation; ASTM G-173-03 air-mass 1.5 direct; GaAs; Si; advanced photovoltaic materials; crystalline silicon solar cells; diffraction-limited focusing; global reference spectra; high-power super-continuum fiber laser; multijunction testing; prism-based spectral shaper; pulsed temporal characteristic; solar simulator design; spectral profile; Gallium arsenide; Measurement by laser beam; NIST; Silicon; Testing; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6317953
  • Filename
    6317953