• DocumentCode
    351963
  • Title

    Scattering from fractal dielectric profiles: the extended boundary condition method

  • Author

    Franceschetti, Iorgio ; Iodice, Antonio ; Riccio, Daiiiele ; Ruello, Giuseppe

  • Author_Institution
    Dipt. di Ingegneria Electron. Telcommun., Univ. di Napoli Federico II, Italy
  • Volume
    4
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1727
  • Abstract
    An electromagnetic model for the study of the scattering from natural rough surfaces is presented. The authors employ a Weierstrass-Mandelbrot (WM) fractal surface model in conjunction with the extended boundary condition method (EBCM). Dielectric profiles are considered. The property of the WM to be an almost periodic function allows one to generalise techniques employed for periodic functions. In particular, the authors express the scattered and transmitted fields as a superposition of Floquet modes, whose directions of propagation are evaluated by means of the grating equation, and whose amplitudes by means of the EBCM. The method leads the authors to express in matrix form the amplitude coefficients of the scattered and transmitted fields in terms of the amplitude coefficients of the known impinging field
  • Keywords
    backscatter; fractals; geophysical techniques; radar cross-sections; radar theory; remote sensing by radar; rough surfaces; terrain mapping; Floquet mode; Weierstrass-Mandelbrot fractal surface model; amplitude coefficient; backscatter; electromagnetic model; extended boundary condition method; fractal dielectric profile; geophysical measurement technique; land surface; matrix form; natural surface; periodic function; radar remote sensing; radar scattering; rough surface; terrain mapping; Boundary conditions; Dielectrics; Electromagnetic scattering; Fractals; Geometry; Gratings; Rough surfaces; Surface roughness; Surface waves; Telecommunications;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-6359-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.2000.857326
  • Filename
    857326