Title :
Unambiguous characterization and specification of D/A converter performance
Author :
Parthasarathy, Kumar L. ; Geiger, Randall
Author_Institution :
Dept. of Electr. Eng. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
Existing parameters used to characterize the performance of D/A converters are often not rigorously defined or are based upon ambiguous nested definitions. This makes it difficult for the user to determine how a particular D/A will really perform in a specific application and leaves some room for uncertainty when testing D/As. Key performance parameters that affect the static and low frequency performance of Nyquist rate converters are unambiguously defined in this paper. Emphasis is on definitions that realistically predict how a D/A will perform and that make parameter measurements in the laboratory practical
Keywords :
characteristics measurement; circuit testing; digital-analogue conversion; D/A converter application; D/A converter performance characterization; D/A converter performance parameters; D/A converter performance specification; D/A converter testing; D/A converters; Nyquist rate converters; low frequency performance; nested definitions; parameter measurements; performance parameters; static performance; test uncertainty; Application software; Availability; Built-in self-test; Costs; Digital communication; Frequency conversion; Laboratories; Performance evaluation; Testing; Wireless communication;
Conference_Titel :
Circuits and Systems, 2000. Proceedings of the 43rd IEEE Midwest Symposium on
Conference_Location :
Lansing, MI
Print_ISBN :
0-7803-6475-9
DOI :
10.1109/MWSCAS.2000.952897