Title :
Design level debugging of timing behavior in embedded systems: Using a model-based approach
Author :
Iyenghar, Padma ; Westerkamp, Clemens ; Wuebbelmann, Juergen ; Pulvermueller, Elke
Author_Institution :
Software Eng. Res. Group, Univ. of Osnabrueck, Osnabrueck, Germany
Abstract :
A robust model-based debugging and testing technique integrated with the Model Driven Development (MDD) approach for memory size constrained, real-time critical embedded target systems is still in its nascent stages. This is especially true for the industry standard MDD-based tools. In addition, a model-based debugging technique or tool chain based on the newly introduced timing diagrams in UML 2.x is not yet available. In this paper, we discuss a model-based, design-level debugging approach with which the timing behavior of embedded targets is visualized with the aid of UML timing diagrams on the host side, in real-time. The proposed approach is suitable for memory size constrained, real-time embedded target systems as the overhead introduced is negligible, constant and known beforehand. Hence, the end-user has the option to include the overhead in the system design phase, thereby making use of a model-based debug solution and at the same time adhering to temporal constraints. A prototype implementation of the proposed approach is discussed and an illustrative example is presented.
Keywords :
Unified Modeling Language; program debugging; real-time systems; UML 2.x; UML timing diagram; design level debugging; memory size; model driven development; model-based debug solution; real-time critical embedded target system; real-time embedded target system; robust model-based debugging; timing behavior; tool chain; Debugging; Embedded software; Graphical user interfaces; Monitoring; Real time systems; Timing; Unified modeling language; UML timing diagram; embedded systems; model-based debugging;
Conference_Titel :
Industrial Informatics (INDIN), 2011 9th IEEE International Conference on
Conference_Location :
Caparica, Lisbon
Print_ISBN :
978-1-4577-0435-2
Electronic_ISBN :
978-1-4577-0433-8
DOI :
10.1109/INDIN.2011.6035011