DocumentCode :
3520592
Title :
In-band optical frequency domain reflectometry in PONs
Author :
Effenberger, Frank J. ; Sui Meng
Author_Institution :
Huawei Technol. Co., Ltd., Plano, TX, USA
fYear :
2008
fDate :
24-28 Feb. 2008
Firstpage :
1
Lastpage :
3
Abstract :
We present the novel concept of using data patterns as the driving signal for optical frequency domain reflectometry in PONs. Algorithms that generate the data patterns are developed, and the technique is confirmed through simulation.
Keywords :
optical fibre networks; reflectometry; algorithms; data patterns; in-band optical frequency domain reflectometry; passive optical networks; Circuits; Frequency domain analysis; Frequency modulation; Optical fiber devices; Optical modulation; Optical network units; Optical receivers; Optical transmitters; Passive optical networks; Reflectometry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Fiber communication/National Fiber Optic Engineers Conference, 2008. OFC/NFOEC 2008. Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-55752-856-8
Type :
conf
DOI :
10.1109/OFC.2008.4528143
Filename :
4528143
Link To Document :
بازگشت