DocumentCode :
3520652
Title :
Characterize the microstructure and reliability of ultra fine pitch BGA joints
Author :
Wang, Lei ; Zhao, Zhenqing ; Wang, Qian ; Lee, Jaisung
Author_Institution :
Samsung Semicond. China R&D Co., Ltd., Suzhou, China
fYear :
2009
fDate :
10-13 Aug. 2009
Firstpage :
674
Lastpage :
678
Abstract :
The solder ball pitch of BGA packages in mass production now is normally above 0.5 mm. To fulfill the future demand of package miniaturization, the 0.4 mm ultra fine pitch BGA solder joint was researched in this paper. The solder volume shrinkage along with the ball pitch decrease was found to affect the joint microstructure, which could be characterized in two aspects: the Sn dendrites in bulk solder became finer, and the so called ldquocross-interactionrdquo in interfacial layer occurred. The joint reliability variation due to volume shrinkage was paid much attention to. Four different alloy content solder balls were evaluated through thermal cycling and drop reliability test, to find out the most proper soldering materials on both NiAu and OSP pad finishes. Our research result indicated that reliable ultra fine pitch joint could be gotten if proper materials and processes adopted. Sn1.0Ag0.5Cu0.02Ni was recommended as the solder alloy composition for the ultra fine pitch BGA usage.
Keywords :
ball grid arrays; copper alloys; fine-pitch technology; mass production; nickel alloys; reliability; silver alloys; solders; thermal analysis; tin alloys; OSP pad; SnAgCuNi; alloy content solder balls; drop reliability test; interfacial layer; mass production; microstructure characterization; nickel aluminium pad; package miniaturization; size 0.4 mm; solder alloy composition; solder ball pitch; soldering materials; thermal cycling; tin dendrites; ultra fine pitch BGA solder joint reliability; volume shrinkage; Cleaning; Joining materials; Mass production; Materials reliability; Materials testing; Microstructure; Optical microscopy; Packaging; Protection; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4658-2
Electronic_ISBN :
978-1-4244-4659-9
Type :
conf
DOI :
10.1109/ICEPT.2009.5270663
Filename :
5270663
Link To Document :
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