Title :
Novel pore-sealing of ordered, porous silica, SBA-15 for low-k underfill materials
Author :
Hsu, Kuo-Yuan ; Chen, Kuei-Yue ; Cheng, Ching-Yuan ; Lee, Jhih-Jhao ; Leu, Jihperng
Author_Institution :
Dept. of Mater. Sci. & Eng., Chiao-Tung Univ., Hsinchu, Taiwan
Abstract :
Underfill materials, consisting of organic resin and inorganic filler, have been widely employed in flip-chip technology for preventing the failure of solder joints during packaging process. In order to meet the requirements of high frequency device applications, low-dielectric-constant underfill is highly desired to alleviate the power consumption issue. However, it is disadvantageous to introduce low-k into organic resin because of its high cost and low volume fraction. Alternative approach is to use highly porous silica filler with appropriate pore sealing prior to mixing with epoxy. In this paper, a siloxane compound, polymerized vinyl-trimethoxysilane (poly-VSQ), was synthesized and applied to an ordered, porous silica structure, SBA-15 to study its effectiveness in pore sealing and interaction with SBA-15 matrix for low-k underfill applications. We have developed a convenient pore sealing treatment using poly-VSQ to achieve a 10.9% reduction (from 3.2 to 2.85) in dielectric constant of underfill material with 15% filler content by fully retaining the high porosity (61%) of SBA15. Moreover, excellent mechanical strength could be maintained as 3.0 GPa without any interfacial delamination.
Keywords :
filled polymers; flip-chip devices; porous materials; sealing materials; solders; SBA-15 matrix; dielectric constant; flip-chip technology; high frequency device applications; highly porous silica filler; inorganic filler; low-dielectric-constant underfill; low-k underfill materials; mechanical strength; ordered porous silica; organic resin; packaging process; poly-VSQ; polymerized vinyl-trimethoxysilane; pore sealing treatment; siloxane compound; solder joints; Costs; Energy consumption; Frequency; Inorganic materials; Joining materials; Organic materials; Packaging; Resins; Silicon compounds; Soldering;
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4658-2
Electronic_ISBN :
978-1-4244-4659-9
DOI :
10.1109/ICEPT.2009.5270695