• DocumentCode
    352144
  • Title

    New high performance sub-1 V circuit technique with reduced standby current and robust data holding

  • Author

    Yoo, Seung-Moon ; Sung-Mo Kang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    4
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    65
  • Abstract
    This paper describes new high performance and low power circuit technique for the sub-1 V region. Two pairs of depletion transistors are used to construct a self-reverse bias condition for the power source transistors and feedback paths from an output node. They can be fabricated without complicated process changes. New scheme shows drastical suppression of leakage currents by about three orders and safe data holding in the standby mode without sacrificing performance degradation in the active mode and reliability problems
  • Keywords
    CMOS digital integrated circuits; CMOS logic circuits; VLSI; circuit feedback; integrated circuit design; leakage currents; logic design; low-power electronics; 1 V; active mode; depletion transistor pairs; feedback paths; leakage current suppression; low power circuit technique; power source transistors; robust data holding; self-reverse bias condition; standby current reduction; standby mode; sub-1 V circuit technique; Degradation; Feedback circuits; Impedance; Low voltage; MOSFETs; Robustness; Substrates; Tellurium; Threshold voltage; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
  • Conference_Location
    Geneva
  • Print_ISBN
    0-7803-5482-6
  • Type

    conf

  • DOI
    10.1109/ISCAS.2000.858689
  • Filename
    858689