DocumentCode :
3522817
Title :
Effects of nitrogen on wettability and reliability of lead-free solder in reflow soldering
Author :
Dong, Mingzhi ; Wang, Yuming ; Cai, Jian ; Feng, Tao ; Pu, Yuanyuan
Author_Institution :
Tsinghua Nat. Lab. for Inf. Sci. & Technol., Beijing, China
fYear :
2009
fDate :
10-13 Aug. 2009
Firstpage :
147
Lastpage :
151
Abstract :
Electronic assembly technology is in the transition from traditional tin-lead to lead-free, which leading to challenge in many aspects. It is accepted that nitrogen can improve the wettability and reliability of lead-free solders; however, few systemic researches have been reported. In this work, the spreading ratio of Sn-Ag-Cu solder was measured through spreading tests under different atmosphere conditions. When oxygen concentration was 1000ppm and reflow temperature was 5degC lower than non-inerted reflow, the spreading ratio of Sn-Ag-Cu solder was comparable with the non-inerted one. PCBs and SMT components were assembled in nitrogen-inerted (oxygen concentration: 1000ppm) and non-inerted reflow. The nitrogen-inerted reflow temperature was 5degC lower. Pull and shear tests were employed as the evaluation of the soldering. Random vibration test and isothermal aging test were conducted as reliability evaluation. The morphology of the interfacial intermetallic compounds (IMCs) during wetting and reliability tests were studied as well.
Keywords :
copper alloys; integrated circuit reliability; printed circuits; reflow soldering; silver alloys; solders; surface mount technology; tin alloys; wetting; PCB components; SMT components; SnAgCu; electronic assembly technology; interfacial intermetallic compounds; isothermal aging test; lead-free solder; morphology; nitrogen effects; reflow soldering; reflow temperature; reliability; wettability; Assembly; Atmosphere; Atmospheric measurements; Environmentally friendly manufacturing techniques; Lead; Nitrogen; Reflow soldering; Surface-mount technology; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4658-2
Electronic_ISBN :
978-1-4244-4659-9
Type :
conf
DOI :
10.1109/ICEPT.2009.5270776
Filename :
5270776
Link To Document :
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