DocumentCode :
3522841
Title :
Designing a processor from the ground up to allow voltage/reliability tradeoffs
Author :
Kahng, Andrew B. ; Kang, Seokhyeong ; Kumar, Rakesh ; Sartori, John
Author_Institution :
ECE Depts., Univ. of California,San Diego, La Jolla, CA, USA
fYear :
2010
fDate :
9-14 Jan. 2010
Firstpage :
1
Lastpage :
11
Abstract :
Current processor designs have a critical operating point that sets a hard limit on voltage scaling. Any scaling beyond the critical voltage results in exceeding the maximum allowable error rate, i.e., there are more timing errors than can be effectively and gainfully detected or corrected by an error-tolerance mechanism. This limits the effectiveness of voltage scaling as a knob for reliability/power tradeoffs. In this paper, we present power-aware slack redistribution, a novel design-level approach to allow voltage/reliability tradeoffs in processors. Techniques based on power-aware slack redistribution reapportion timing slack of the frequently-occurring, near-critical timing paths of a processor in a power- and area-efficient manner, such that we increase the range of voltages over which the incidence of operational (timing) errors is acceptable. This results in soft architectures - designs that fail gracefully, allowing us to perform reliability/power tradeoffs by reducing voltage up to the point that produces maximum allowable errors for our application. The goal of our optimization is to minimize the voltage at which a soft architecture encounters the maximum allowable error rate, thus maximizing the range over which voltage scaling is possible and minimizing power consumption for a given error rate. Our experiments demonstrate 23% power savings over the baseline design at an error rate of 1%. Observed power reductions are 29%, 29%, 19%, and 20% for error rates of 2%, 4%, 8%, and 16% respectively. Benefits are higher in the face of error recovery using Razor. Area overhead of our techniques is up to 2.7%.
Keywords :
energy conservation; error analysis; microprocessor chips; optimisation; error rate; error-tolerance mechanism; operational errors; optimization; power consumption; power savings; power-aware slack redistribution; processor design; reliability tradeoff; soft architectures; timing errors; voltage scaling; voltage tradeoff; Circuits; Error analysis; Error correction; Flip-flops; Frequency; Latches; Process design; Timing; Virtual colonoscopy; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Performance Computer Architecture (HPCA), 2010 IEEE 16th International Symposium on
Conference_Location :
Bangalore
ISSN :
1530-0897
Print_ISBN :
978-1-4244-5658-1
Type :
conf
DOI :
10.1109/HPCA.2010.5416652
Filename :
5416652
Link To Document :
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