DocumentCode :
3523469
Title :
Radiation effect models in solar cells - Comparison of simulations with experimental data
Author :
Fedoseyev, Alex ; Bald, Tim ; Turowski, Marek ; Raman, Ashok ; Cress, Cory ; Walters, Robert ; Warner, Jeff ; Hubbard, Seth
Author_Institution :
CFDRC, Huntsville, AL, USA
fYear :
2012
fDate :
3-8 June 2012
Abstract :
We present the radiation effect models for solar cells used in NanoTCAD device simulator and provide comparison with experimentally measured on solar cell performance. The device modeled is a p+ n GaAs solar cell. Dark, Light IV curves and corresponding performance parameters are simulated and compared with experimental results for 2 MeV protons at varying fluence. Majority carrier defect introduction rates for n-type GaAs used in the NanoTCAD simulations were taken from deep level transient spectroscopy (DLTS) data provided by the Naval Research Lab (NRL). Results show a good match between simulations and experimental results.
Keywords :
III-V semiconductors; gallium arsenide; solar cells; DLTS data; GaAs; NRL; NanoTCAD device simulator; Naval Research Lab; deep level transient spectroscopy data; electron volt energy 2 MeV; light IV curves; p+ solar cell; radiation effect models; Current measurement; Degradation; Electron traps; Mathematical model; Photovoltaic cells; Voltage measurement; Experimental data; Radiation Effects Models; Simulation; Solar cells; TCAD;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6318174
Filename :
6318174
Link To Document :
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