Chemical and physical changes observed in poly(oxy-1,4 phenylsulfonyl-1,4 phenylene) following electrical stressing

Author

Uttamlal, M. ; Falcoz, S. ; Holmes-Smith, A.S. ; Hepburn, D.M. ; Stewart, B.G. ; Fouracre, R.A.

Author_Institution

Sch. of Eng., Sci. & Design, Glasgow Caledonian Univ.

fYear

2006

fDate

15-18 Oct. 2006

Firstpage

65

Lastpage

68

Abstract

High voltage insulation failure can arise because of the physical and chemical properties of the material and intrinsic changes through use, aging and weathering. Overall aging is believed to produce localised defects and structural points which eventually fail under electrical stressing. This paper will present FT-IR and AFM evidence to show some of the chemical and physical changes in the insulating polymer, poly(oxy-1,4 phenylsulfonyl-1,4 phenylene) (PES) when subjected to short duration high voltage electric discharge activity in the air above the surface of the polymer film.

Keywords

Fourier transform spectra; ageing; atomic force microscopy; discharges (electric); environmental degradation; high-voltage engineering; infrared spectra; organic insulating materials; polymer films; AFM; FTIR; aging; chemical change; electrical stress; high voltage electric discharge activity; high voltage insulation failure; insulating polymer; localised defects; physical change; poly(oxy-1,4 phenylsulfonyl-1,4phenylene); polymer film; structural points; weathering; Aging; Atomic force microscopy; Chemicals; Costs; Dielectrics and electrical insulation; Plastic insulation; Polymer films; Power transformer insulation; Surface discharges; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on

Conference_Location

Kansas City, MO

Print_ISBN

1-4244-0547-5

Electronic_ISBN

1-4244-0547-5

Type

conf

DOI

10.1109/CEIDP.2006.312063

Filename

4105371