• DocumentCode
    3524318
  • Title

    Effect of composition on high efficiency CZTSSe devices fabricated using co-sputtering of compound targets

  • Author

    Chawla, Vardaan ; Clemens, Bruce

  • Author_Institution
    AQT Solar, Sunnyvale, CA, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    Recent work on Cu2ZnSn(S,Se)4 (CZTSSe) has shown that it is an excellent candidate for use in thin film solar cells due to its earth abundant, inexpensive, non-toxic constituents and optimal material properties. However, the composition window for growth of CZTSSe capable of high efficiency is still unknown. The focus of this work is to use sputter deposition to synthesize this material as a thin film and determine a composition window for growth of high efficiency CZTSSe devices. CZTSSe thin films of various compositions were grown using co-sputtering of compound targets followed by an anneal at high temperature. Efficiency of devices was mapped as function of copper, zinc, tin, selenium and sulfur content in the films. Extraneous phases that are relatively benign (ZnS, SnS2) and those that are detrimental (Cu2S) to device performance were identified using x-ray diffraction. The range of efficiencies mapped in this work was 0-8% and the best efficiency achieved using this fabrication process was 9.3%.
  • Keywords
    X-ray diffraction; annealing; copper compounds; solar cells; sputter deposition; thin film devices; zinc compounds; Cu2ZnSn(SSe)4; X-ray diffraction; annealing; composition effect; compound target cosputtering; copper content; efficiency 0 percent to 8 percent; efficiency 9.3 percent; high efficiency devices; nontoxic constituents; optimal material properties; selenium content; sputter deposition; sulfur content; thin film solar cells; tin content; zinc content; Copper; Films; Photovoltaic cells; Tin; X-ray scattering; Zinc; CZTS; CZTSSe; photovoltaic cells; solar cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318212
  • Filename
    6318212