Title :
Impact of link quality estimation errors on routing metrics for wireless sensor networks
Author :
Krogmann, Martin ; Tian, Tian ; Stromberg, Guido ; Heidrich, Mike ; Huemer, Mario
Author_Institution :
Fraunhofer ESK, Munich, Germany
Abstract :
Link quality-based routing protocols are often utilized in wireless sensor networks. Link quality estimation algorithms are used to retrieve information about the link quality, which is evaluated to choose the best available path. Concurrently, recent work has revealed severe inaccuracies in link quality estimations provided by modern short-range wireless devices. The sensitivity of routing protocols to such errors in the estimation of the link quality has not been considered so far. In this paper, we define two main classes of link quality-based routing metrics and examine these classes. We present a method to estimate the sensitivity of routing metrics to link quality estimation errors and confirm this method by simulations. Some routing metrics are surprisingly strong influenced by estimation errors. This finding questions the applicability of these protocols in large-scale networks and necessitates that the impact of link quality estimation errors is explicitly regarded in future developments of link-quality-based routing metrics to create more robust metrics. Our proposed method to estimate the sensitivity of routing metrics on link quality estimation errors shows to be helpful here.
Keywords :
routing protocols; wireless sensor networks; large-scale networks; link quality estimation errors; link quality-based routing protocols; modern short-range wireless devices; routing metrics; wireless sensor networks; Energy consumption; Energy efficiency; Estimation error; Information retrieval; Instruments; Large-scale systems; Robustness; Routing protocols; Taylor series; Wireless sensor networks;
Conference_Titel :
Intelligent Sensors, Sensor Networks and Information Processing (ISSNIP), 2009 5th International Conference on
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4244-3517-3
Electronic_ISBN :
978-1-4244-3518-0
DOI :
10.1109/ISSNIP.2009.5416804