• DocumentCode
    3524686
  • Title

    Comparison of electroluminescence phenomenon in LDPE, PET and PEN under the application of high electrical stress

  • Author

    Ariffin, A. Mohd ; Lewin, P.L. ; Dodd, S.J.

  • Author_Institution
    Sch. of Electron. & Comput. Sci., Southampton Univ.
  • fYear
    2006
  • fDate
    15-18 Oct. 2006
  • Firstpage
    260
  • Lastpage
    263
  • Abstract
    When a solid-state material is subjected to a high electrical field stress, an emission of light known as electroluminescence (EL), will occur. This phenomenon has been used extensively to study charge injection and recombination mechanisms at the metal-polymer interface and as a probe to study early electrical ageing in insulating polymers. Most of the EL studies undertaken nowadays deal with measurements on polyethylene since this material is widely used in high voltage cable applications. Therefore this paper focuses on the EL measurements made on additive-free low-density polyethylene (LDPE) film. In addition to this, the voltage dependence and spectral characteristics of EL will be compared with identical measurements made on polyethylene terephthalate (PET) and polyethylene naphthalate (PEN) films; since EL phenomenon for these materials is relatively better characterized. A comparison of measured EL characteristics between these three different types of polymer will be discussed.
  • Keywords
    ageing; cable insulation; charge injection; electroluminescence; metal-insulator boundaries; polyethylene insulation; LDPE; PEN; PET; charge injection; charge recombination mechanism; electrical ageing; electroluminescence; high electrical field stress; high voltage cable; insulating polymers; low-density polyethylene film; metal-polymer interface; polyethylene naphthalate; polyethylene terephthalate; solid-state material; Aging; Electroluminescence; Plastic films; Polyethylene; Polymers; Positron emission tomography; Probes; Solid state circuits; Stress; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
  • Conference_Location
    Kansas City, MO
  • Print_ISBN
    1-4244-0547-5
  • Electronic_ISBN
    1-4244-0547-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2006.312111
  • Filename
    4105419