• DocumentCode
    352486
  • Title

    Assessing self-organization using order metrics

  • Author

    Azcarraga, Arnulfo P.

  • Author_Institution
    Sch. of Comput., Nat. Univ. of Singapore, Singapore
  • Volume
    6
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    159
  • Abstract
    Self-organizing maps (SOM) are proving to be useful as data analysis and visualization tools because they can visually render the data analysis results in 2D or 3D, and do not need category information for each input pattern. But this unsupervised nature of the training process makes it difficult to have separate training and test sets to determine the quality of the training process, which is done quite naturally for supervised neural network learning algorithms. In applications like data analysis, where there is little clue as to the way the SOM is supposed to look after training, it is important to be able to assess the quality of the self-organization process independent of the application, and without need for category information. The average unit disorder has been used to assess the quality of the ordering of a self-organized map. It is shown here that this same order metric can be used to assess the quality of the self-organization process itself. Based on this order metric, it can be determined whether the SOM has adequately learned, whether the parameters used to train the SOM have been correctly specified, and whether the SOM variant used is well-suited to the specific problem at hand
  • Keywords
    data analysis; data visualisation; self-organising feature maps; SOM; average unit disorder; data analysis tools; order metrics; self-organizing maps; supervised neural network learning algorithms; unsupervised training; visualization tools; Data analysis; Data visualization; Euclidean distance; Joining processes; Lattices; Neural networks; Rendering (computer graphics); Self organizing feature maps; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 2000. IJCNN 2000, Proceedings of the IEEE-INNS-ENNS International Joint Conference on
  • Conference_Location
    Como
  • ISSN
    1098-7576
  • Print_ISBN
    0-7695-0619-4
  • Type

    conf

  • DOI
    10.1109/IJCNN.2000.859390
  • Filename
    859390