• DocumentCode
    3525366
  • Title

    High-resolution local current measurement of CdTe solar cells

  • Author

    Yoon, Heayoung P. ; Ruzmetov, Dmitry ; Haney, Paul M. ; Leite, Marina S. ; Hamadani, Behrang H. ; Talin, A. Alec ; Zhitenev, Nikolai B.

  • Author_Institution
    Center for Nanoscale Sci. & Technol., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    We investigate local electronic properties of CdTe solar cells using electron beam to excite electron-hole pairs and evaluate spatially resolved photocurrent characteristics. Standard semiconductor processes were used to fabricate Ohmic metal contacts on the surface of p-type CdTe / n-type CdS device extracted from a commercial solar panel. An ion milling process was used to prepare cross-sections of the devices. Local injection of carriers was controlled by an acceleration voltage of electron beam (1 kV to 30 kV) in a scanning electron microscope, and the results were correlated with the local morphology, microstructure, and chemical composition of the devices.
  • Keywords
    II-VI semiconductors; cadmium compounds; electric current measurement; scanning electron microscopy; solar cells; CdTe; carrier local injection; chemical composition; commercial solar panel; electron beam acceleration voltage; electron-hole pairs; high-resolution local current measurement; ion milling process; local electronic properties; local morphology; microstructure; n-type device; ohmic metal contact fabrication; p-type device; scanning electron microscope; solar cells; spatially resolved photocurrent characteristics; standard semiconductor processes; voltage 1 kV to 30 kV; Materials; Metals; CdTe; EBIC; cross section; electron beam induced current; focused ion beam; grain boundary; solar cells; thin film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318262
  • Filename
    6318262