• DocumentCode
    3527015
  • Title

    Examination of the influence of streamer growth criteria on morphology

  • Author

    Kim, Minkyu ; Hebner, Robert E. ; Hallock, Gary A.

  • Author_Institution
    Texas Univ., Austin, TX
  • fYear
    2006
  • fDate
    15-18 Oct. 2006
  • Firstpage
    772
  • Lastpage
    775
  • Abstract
    Work by Fowler, Daveny, and Hagedom showed that the morphology of an anode streamer could be modeled as stochastic growth of a branching fractal tree in point-plane geometry. In their work, the experimentally observed range of fractal densities, from sparse to bushy, was modeled by using two assumptions. One was that the growth was driven by En, where E is the local electric field and n is 1, 2, 3, or 4. The other assumption is that there was a threshold (cutoff) electric field strength for streamer growth in a particular direction. This investigation first reproduced the results of the earlier study to demonstrate that the model and its software implementation yielded the previous results. The model was then modified to operate under a different set of assumptions. In this case, only linear electric field dependence was assumed, and the number density of available electrons was used as a parameter to match the observed data. In addition, rather than assume a sharp cutoff of the threshold field strength, the cutoff was assumed to be a function of electron density. Under these assumptions, it was also possible to simulate the experimentally observed behavior of anode streamers. The current assumptions are consistent with those that have proven to be useful in an earlier investigation.
  • Keywords
    anodes; discharges (electric); electron density; stochastic processes; anode streamer; branching fractal tree; electron density; linear electric field dependence; point-plane geometry; streamer growth criteria; streamer morphology; threshold electric field strength; Anodes; Electrons; Fractals; Geometry; Laplace equations; Morphology; Production; Solid modeling; Stochastic processes; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
  • Conference_Location
    Kansas City, MO
  • Print_ISBN
    1-4244-0547-5
  • Electronic_ISBN
    1-4244-0547-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2006.312046
  • Filename
    4105547