Title :
Critical path analysis considering the signal transition time
Author :
Sang-Yaol Hao ; Ki-Hyan Kim ; Hwan Kim, Young
Author_Institution :
Design Methodolgy Team, Hyundai MicroElectron. Co. Ltd., Seoul, South Korea
Abstract :
This paper proposes a critical path analysis algorithm that considers the effects of the signal transition time. First, the proposed algorithm finds the possible minimum transition time and the possible maximum transition time. Then, within the range, it extracts the maximum delay of each gate and computes the PERT delay. Finally, it performs depth first search under searching condition that the sum of a current searching path and a PERT delay is larger than that of critical path evaluated already. Experimental results show that the proposed algorithm finds the correct critical paths of the ISCAS 85 benchmark circuits where the existing critical path analysis methods fail. Experimental results also show that the complexity of the proposed algorithm is linear with the circuit size
Keywords :
PERT; VLSI; critical path analysis; delays; integrated circuit design; tree searching; PERT delay; VLSI design; critical path analysis algorithm; depth first search; signal transition time; Algorithm design and analysis; Circuits; Delay effects; Design methodology; Digital systems; Energy consumption; Failure analysis; Microelectronics; Signal analysis; Silicon;
Conference_Titel :
VLSI and CAD, 1999. ICVC '99. 6th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-5727-2
DOI :
10.1109/ICVC.1999.820813