DocumentCode :
3528465
Title :
The effect of external magnetic field on mark size during field emission assisted magnetic probe recording on CoNi/Pt multilayers
Author :
Zhang, Li ; Bain, James A. ; Zhu, Jian-Gang ; Abelmann, Leon ; Onoue, Takahiro
Author_Institution :
DSSC, Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
245
Lastpage :
246
Abstract :
In this work, we characterize a heat-assisted magnetic recording process potentially suitable for proposed probe-based storage systems. A scanning tunneling microscope (STM) is used to locally heat a uniformly magnetized perpendicular recording medium via field emission current. The recording medium is a 30 nm thick CoNi/Pt multilayer film (HC = 100 kA/m [1.2 kOe], MS = 360 kA/m) with a 23 nm thick Pt seedlayer, fabricated on a bare Si substrate. Voltage pulses were applied between STM tip (made of Ir/Pt) and the medium to write marks with external magnetic field applied. A magnetic force microscope (MFM) is used to image marks. Mark size was measured as the FWHM of MFM phase signal. Experimental results show that mark size increases with increasing positive field and decreases with increasing negative field. A model is quantitatively simulate our experimental results and we are able to predict tip and medium configurations and applied powers that should permit marks appropriate for recording at 1 Tbit/in2 and beyond.
Keywords :
cobalt alloys; ferromagnetic materials; field emission; magnetic force microscopy; magnetic multilayers; magnetic thin films; metallic thin films; nickel alloys; platinum; scanning tunnelling microscopy; thermomagnetic recording; 23 nm; 30 nm; CoNi-Pt; CoNi/Pt multilayer film; MFM phase signal; Pt seedlayer; field emission current; heat-assisted magnetic recording process; magnetic force microscope; mark size; probe-based storage systems; scanning tunneling microscope; write marks; Heat-assisted magnetic recording; Magnetic field measurement; Magnetic films; Magnetic force microscopy; Magnetic multilayers; Magnetic recording; Perpendicular magnetic recording; Predictive models; Probes; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1463551
Filename :
1463551
Link To Document :
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