• DocumentCode
    3528644
  • Title

    A criterion for the enhancement of time-frequency masks in missing data recognition

  • Author

    Pullella, Daniel ; Togneri, Roberto

  • Author_Institution
    Sch. of Electr., Electron. & Comput. Eng., Univ. of Western Australia, Perth, WA
  • fYear
    2009
  • fDate
    19-24 April 2009
  • Firstpage
    4185
  • Lastpage
    4188
  • Abstract
    Despite their effectiveness for robust speech processing, missing data techniques are vulnerable to errors in the classification of the input speech signal´s time-frequency points. A direct method for the removal of these mask errors is through the top-down optimization of the estimated mask, however this requires a measure to evaluate the mask quality without a priori noise knowledge. In this paper we propose the normalized likelihood confidence as such a criterion for robust speaker recognition. In this approach the accuracy with which an estimated mask classifies time-frequency points as corrupt or reliable is related to its likelihood score confidence. This is based on the conceptual effect of binary mask errors on the model likelihood distributions produced by accumulated marginalization densities. Experimental results confirm a relationship between the normalized likelihood distance and the accuracy of the time-frequency mask produced by various estimation strategies.
  • Keywords
    maximum likelihood estimation; speaker recognition; speech enhancement; time-frequency analysis; binary mask error; missing data recognition; model likelihood distribution; speaker recognition; time-frequency masking; Acoustic noise; Computer errors; Noise measurement; Noise robustness; Speaker recognition; Speech coding; Speech enhancement; Speech processing; Time frequency analysis; Working environment noise; missing data; robust speaker recognition; time-frequency masking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech and Signal Processing, 2009. ICASSP 2009. IEEE International Conference on
  • Conference_Location
    Taipei
  • ISSN
    1520-6149
  • Print_ISBN
    978-1-4244-2353-8
  • Electronic_ISBN
    1520-6149
  • Type

    conf

  • DOI
    10.1109/ICASSP.2009.4960551
  • Filename
    4960551