• DocumentCode
    352869
  • Title

    Multivariate analysis of airborne remote sensing and topographic features for corn yield spatial pattern discrimination

  • Author

    Sérélé, Charles Z. ; Gwyn, Q.J. ; Boisvert, Johanne B. ; Pattey, Elizabeth ; Brazeau, Stéphanie ; McLaughlin, Neil ; Daoust, Gilles

  • Author_Institution
    Centre d´´Appl. et de Recherches en Teledetection, Sherbrooke Univ., Que., Canada
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    381
  • Abstract
    Multivariate discriminant analysis (MDA) was applied to airborne remotely sensed and topographic data to select the best indicators of corn yield spatial variability. In the MDA models, elevation, slope and texture indices (contrast and second angular moment) contribute most to the discrimination of corn yield classes. The classification of yield based on the MDA results in yield classes that are well sorted in a proportion of 99% low and 71% medium yield pixels, while high yield pixels were correctly classified in 88% of the cases. The overall classification rate of 86% demonstrates that, on the basis of MDA, using texture indices and topographic data and, to a lesser extent vegetation indices, the authors can discriminate corn yield spatial patterns
  • Keywords
    agriculture; geophysical signal processing; geophysical techniques; image classification; image texture; remote sensing; vegetation mapping; Zea; agriculture; airborne remote sensing; canopy; corn; crop; crops; geophysical measurement technique; image classification; imagetexture; maize; multivariate analysis; multivariate discriminant analysis; remote sensing; spatial pattern discrimination; spatial variability; topographic feature; vegetation mapping; yield; Agriculture; Atmospheric modeling; Chemicals; Crops; Environmental management; Physics; Remote sensing; Soil; Spatial resolution; Vegetation mapping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-6359-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.2000.860526
  • Filename
    860526